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 All Categories    PIFOC® High-Speed Nanofocusing/Scanning Z-Drives with Direct Metrology
All Categories > Nanopositioning: Piezo Stages,
Actuators, Piezo Controllers, Sensors > Piezo Nanopositioning Systems > Z-/Tip/Tilt Stages (with Aperture) > PIFOC® High-Speed Nanofocusing/Scanning Z-Drives with Direct Metrology > View Items  
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PIFOC® High-Speed Nanofocusing/Scanning Z-Drives with Direct Metrology

 
Check up to five results to perform an action.

  • Scans and Positions Objectives with Sub-nm Resolution
  • High Linearity and Stability with Direct-Measuring Sensors
  • Travel to 100 µm, fast Settling Time
  • Very Straight Motion for Enhanced Focus Stability
  • Ask about DIC Prism Holder Option
  • Compatible with Metamorph™ Imaging Software
  • Quick Lock Adapter for Easy Attachment



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  Results 1 - 4 of 4 1 

Item #

Item Name

Travel Range

Open Loop Resolution

Closed Loop Linearity

Push Force Capacity (in Operating Direction)

Unloaded Resonant Frequency

Closed Loop Resolution

P-721.CLQ PIFOC® High-Speed Nanofocusing/Scanning Z-Drives with Direct Metrology 90 µm 0.5 nm 0.03 % 100 N .580 kHz 0.70 nm
P-721.CDQ PIFOC® High-Speed Nanofocusing/Scanning Z-Drives with Direct Metrology 90 µm 0.5 nm 0.03 % 100 N .580 kHz 0.70 nm
P-721.LLQ PIFOC® High-Speed Nanofocusing/Scanning Z-Drives with Direct Metrology 90 µm 0.5 nm 0.10 % 100 N .580 kHz 10.00 nm
P-721.0LQ PIFOC® High-Speed Nanofocusing/Scanning Z-Drives with Direct Metrology 90 µm 0.5 nm N/A 100 N .580 kHz N/A
  Results 1 - 4 of 4 1 


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