PI USA
PI USA
US Headquarters
16 Albert Street
Auburn, MA 01501
United States
Phone: 508-832-3456
Fax: 508-832-0506
Email: contact@pi-usa.us
Website: www.pi-usa.us
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  • Scans and Positions Objectives with Sub-nm Resolution
  • High Linearity and Stability with Direct-Measuring Sensors
  • Travel to 100 µm, fast Settling Time
  • Ideal for Automated Optical Axis Adjustment and Alignment
  • Very Straight Motion for Enhanced Focus Stability
  • Ask about DIC Prism Holder Option
  • Compatible with Metamorph™ Imaging Software
  • Quick Lock Adapter for Easy Attachment
Product Image - PIFOC High-Speed Nanofocusing/Scanning Z-Drives with Direct Metrology
Unit of Measure
1 

Item #

Item Name

Travel Range

Open Loop Resolution

Closed Loop Linearity

Push Force Capacity (in Operating Direction)

Unloaded Resonant Frequency

Closed Loop Resolution

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P-721.CLQ N/A PIFOC® High-Speed Nanofocusing/Scanning Z-Stages with Direct Metrology N/A 90 µm N/A 0.5 nm N/A 0.03 % N/A 100 N N/A .580 kHz N/A 0.70 nm N/A Specifications, CAD / Drawings, Manuals, Videos
P-721.CDQ N/A PIFOC® High-Speed Nanofocusing/Scanning Z-Stages with Direct Metrology N/A 90 µm N/A 0.5 nm N/A 0.03 % N/A 100 N N/A .580 kHz N/A 0.70 nm N/A Specifications, CAD / Drawings, Manuals, Videos
P-721.LLQ N/A PIFOC® High-Speed Nanofocusing/Scanning Z-Stages with Direct Metrology N/A 90 µm N/A 0.5 nm N/A 0.10 % N/A 100 N N/A .580 kHz N/A 10.00 nm N/A Specifications, CAD / Drawings, Manuals, Videos
P-721.0LQ N/A PIFOC® High-Speed Nanofocusing/Scanning Z-Stages with Direct Metrology N/A 90 µm N/A 0.5 nm N/A N/A 100 N N/A .580 kHz N/A N/A Specifications, CAD / Drawings, Manuals, Videos
Unit of Measure
1