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XY Piezo Nanopositioning / Scanning Stages With Parallel Metrology
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XY Piezo Nanopositioning / Scanning Stages With Parallel Metrology
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larger image
100 x 100 µm Travel Range
For XY Scanning & Positioning
Parallel-Kinematics/Metrology for Enhanced Responsiveness / Multi-Axis Precision
Precision Flexure-Guiding System
Integrated Capacitive Sensors for Resolution <0.3 nm
50 x 50 mm Clear Aperture
Ultra-High Vacuum Version Available
Ultra-Fast XY and XYZ Versions Available
PICMA® High-Performance Multilayer Piezo Drives
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Item #
Item Name
Active Axes
Open Loop Resolution
Max. Normal Load
Travel Range
Closed Loop Linearity
Push Force Capacity (in Operating Direction)
Unloaded Resonant Frequency
P-733.2CD
XY Piezo Nanopositioning / Scanning Stages With Parallel Metrology
XY
0.2
nm
20
N
100 x 100
µm
0.03
%
300
N
.5
kHz
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