P-541 and P-542 nanopositioning XY-tables use flexure-guided piezo-amplified drive systems to achieve high performance, high accuracy and speed. The low-profile design allows for easy integration into microscopy and surface metrology applications. The large open aperture is an advantage in super-resolution microscopy semiconductor metrology and mask alignment.
These 2-axis nanopositioning stages are available with closed-loop position feedback for very high accuracy, nanometer repeatability and resolution in the nanometer and sub-nanometer range. For long travel linear slides and precision XY-stages, check the V-741 motorized nanopositioner XY-tables with 3-phase linear motors.
P-541 stages provide, zero-maintenance and a very long lifetime, because of the wear-free flexure guided design and the integrated PICMA® PZT piezo actuators that were life tested 100 Billion cycles for the Mars Mission. life tested 100 Billion cycles for the Mars Mission. Computer Control / Software: These XY nanopositioning tables be computer controlled via a digital nanopositioning motion controller of the E-727 multi-axis controller series. LabView drivers and MatLab examples are available for easy integration.
Item # |
Item Name |
Active Axes |
Unloaded Resonant Frequency |
Open Loop Resolution |
Max. Normal Load |
Travel Range |
Closed Loop Linearity |
Push Force Capacity |
Click Link for More Information |
---|---|---|---|---|---|---|---|---|---|
P-541.2CD | N/A Low-Profile, Piezo Nanopositioning XY-Table for Scanning Microscopy with Parallel Metrology | N/A XY | N/A .5 kHz | N/A 0.2 nm | N/A 20 N | N/A 200 x 200 µm | N/A 0.03 % | N/A 50 N |
N/A Specifications, CAD / Drawings, Manuals, Videos |
P-542.2CD | N/A Low-Profile, Piezo Nanopositioning XY-Table for Scanning Microscopy with Parallel Metrology | N/A XY | N/A .370 kHz | N/A 0.4 nm | N/A 20 N | N/A 200 x 200 µm | N/A 0.03 % | N/A 50 N |
N/A Specifications, CAD / Drawings, Manuals, Videos |
P-541.2DD | N/A Low-Profile, Piezo Nanopositioning XY-Table for Scanning Microscopy with Parallel Metrology | N/A XY | N/A 1.50 kHz | N/A 0.1 nm | N/A 20 N | N/A 200 x 200 µm | N/A 0.03 % | N/A 50 N |
N/A Specifications, CAD / Drawings, Manuals, Videos |