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> Piezo Nanopositioning Systems > Multi-Axis Stages with Aperture > Low-Profile OEM XY Piezo-Scanners for Imaging Applications > Item # P-714.2SL
 
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Item # P-714.2SL, Low-Profile OEM XY Piezo-Scanners for Imaging Applications



  • Ideal for Interlacing, CCD Resolution Enhancement
  • Compact Size of only 45 x 45 x 6 mm
  • Clear Aperture
  • Highly Cost - Efficient Design
  • 15 x 15 µm Travel Range
  • Parallel - Kinematics Design for Higher Dynamics




 Specifications   

Active Axes

XY

Closed Loop Linearity

0.30 %

Stiffness

0.8 N/µm ±20%

Weight (with Cables)

105 g ±5%

Body Material

S

θX, θY

Typ. < 1 µrad < 5 µrad

θZ

Typ. < 5 µrad < 15 µrad

Electrical Capacitance

1.5 µF ±20% / axis

Dynamic Operating Current Coefficient (DOCC)

View
1.7 µA/(Hz x µm) / axis

Unloaded Resonant Frequency

2.250 kHz

Resonant Frequency at 20 g Load

1310 Hz ±20%

Resonant Frequency at 50 g Load

1020

Resonant Frequency at 100 g Load

460 Hz ±20%

Operating Temperature Range

-20 to 80 ºC

Voltage Connection

VL

Recommended Amplifier / Controller

D, H

Integrated Feedback Sensor

SGS

Sensor Connection

L

Application

CCD camera technology
Imaging

Interlacing, image resolution enhancement

Microscopy

Optical metrology

Quality assurance




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