PI - Motion Control & Nanopositioning Solutions

Piezo Actuators
Nanopositioning & Scanning Systems
Active Optics /
Steering Mirrors
Capacitive Position Sensors
Piezo Drivers & Nanopositioning Controllers
Hexapods /
Motorized Positioners
Photonics Alignment Solutions
Motion Controllers
Ceramic Linear Motors & Stages

Tech blog
Videos
News

Search Catalog
      GO   
 All Categories    Low-Profile Z/Tip/Tilt Piezo Nanopositioning Stages for Microscopy with Parallel Metrology
All Categories > Nanopositioning: Piezo Stages,
Actuators, Piezo Controllers, Sensors
> Piezo Nanopositioning Systems > Z-/Tip/Tilt Stages (with Aperture) > Low-Profile Z/Tip/Tilt Piezo Nanopositioning Stages for Microscopy with Parallel Metrology > View Items
 

Low-Profile Z/Tip/Tilt Piezo Nanopositioning Stages for Microscopy with Parallel Metrology

Check up to five results to perform an action.

  • Lower Profile for Easy Integration: 16.5 mm
  • Z and Tip/Tilt Versions
  • Choice of Strain Gauge (Lower Cost) or Capacitive Sensors (Higher Performance)
  • 100 µm Linear Travel Range, 1 mrad Tilt
  • 80 x 80 mm Clear Aperture
  • PICMA® High-Performance Multilayer Piezo Actuators for Superior Lifetime
  • Ideal for fast Z-Stack Acquisition and 3D Deconvolution Imaging




    border="0" Printable Page  
    Email Email This Page  
    Save To Favorites Save To Favorites
  
Compare Items
   
  Results 1 - 2 of 2 1 

Item #

Item Name

Active Axes

Unloaded Resonant Frequency

Open Loop Resolution

Max. Normal Load

Closed Loop Resolution

Travel Range

Closed Loop Linearity

Push Force Capacity

P-541.ZCD Low-Profile Z/Tip/Tilt Piezo Nanopositioning Stages for Microscopy with Parallel Metrology Z .410 kHz 0.20 nm 20 N 0.80 nm 150 µm 0.03 % 100 N
P-541.TCD Low-Profile Z/Tip/Tilt Piezo Nanopositioning Stages for Microscopy with Parallel Metrology ZΘXΘY .410 kHz 0.20 nm 20 N 0.80 nm 150 µm 0.03 % 100 N
  Results 1 - 2 of 2 1 


© 1996-2017 PI (Physik Instrumente) GmbH & Co. KG. All rights reserved. Specifications subject to change without notice.