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 All Categories    PIFOC™ High-Speed Microscope Objective Nanofocusing/Scanning Z-Drives
All Categories > Nanopositioning: Piezo Stages,
Actuators, Piezo Controllers, Sensors
> Piezo Nanopositioning Systems > Z-/Tip/Tilt Stages (with Aperture) > Item # P-720.00

Item # P-720.00, PIFOC™ High-Speed Microscope Objective Nanofocusing/Scanning Z-Drives

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  • Scans and Positions Objectives with Sub-nm Resolution
  • Low Inertia for Fast Settling
  • Frictionless Precision Flexure Guiding System
  • Travel to 100 µm
  • Straightness of Travel ≤13 µrad
  • PICMA® High-Performance Multilayer Piezo Drives


Travel Range

100 µm

Open Loop Resolution

1.00 nm

Push Force Capacity (in Operating Direction)

100 N

Unloaded Resonant Frequency

0.400 kHz

Weight (with Cables)

100 g ±5%

Body Material


Max. Objective Diameter

25 mm


0.2 N/µm ±20%

Pull Force Capacity (in Operating Direction)

20 N

Tilt (θX, θY) (typ.)

13 µrad

Lateral Runout (Y) (typ.)

100 nm

Electrical Capacitance

3.0 µF ±20%

Dynamic Operating Current Coefficient (DOCC)

3.8 µA/(Hz 3 µm)

Resonant Frequency at 120 g Load

180 Hz ±20%

Resonant Frequency at 200 g Load

150 Hz ±20%

Operating Temperature Range

-20 to +80 °C

Voltage Connection


Recommended Driver / Controller

G, C, (A)


Autofocus systems

Confocal microscopy

Disk drive testing

Scanning interferometry

Semiconductor test equipment

Surface structure analysis


·  Dimensional Drawing

·  Microscope Turret


Description / Datasheet / Order Info

© 1996-2017 PI (Physik Instrumente) GmbH & Co. KG. All rights reserved. Specifications subject to change without notice.