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 All Categories    Low-Profile OEM XY Piezo-Scanners for Imaging Applications
All Categories > Nanopositioning: Piezo Stages,
Actuators, Piezo Controllers, Sensors
> Piezo Nanopositioning Systems > Multi-Axis Stages with Aperture > Low-Profile OEM XY Piezo-Scanners for Imaging Applications > Item # P-714.20L
 

Item # P-714.20L, Low-Profile OEM XY Piezo-Scanners for Imaging Applications


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  • Ideal for Interlacing, CCD Resolution Enhancement
  • Compact Size of only 45 x 45 x 6 mm
  • Clear Aperture
  • Highly Cost - Efficient Design
  • 15 x 15 µm Travel Range
  • Parallel - Kinematics Design for Higher Dynamics




 Specifications   

Active Axes

XY

Open Loop Resolution

0.10 nm

Stiffness

0.8 N/µm ±20%

Weight (with Cables)

105 g ±5%

Body Material

S

Travel Range

20 µm

θX, θY

Typ. < 1 µrad < 5 µrad

θZ

Typ. < 5 µrad < 15 µrad

Electrical Capacitance

1.5 µF ±20% / axis

Dynamic Operating Current Coefficient (DOCC)

View
1.7 µA/(Hz x µm) / axis

Unloaded Resonant Frequency

2.250 kHz

Resonant Frequency at 20 g Load

1310 Hz ±20%

Resonant Frequency at 50 g Load

1020

Resonant Frequency at 100 g Load

460 Hz ±20%

Operating Temperature Range

-20 to +80 °C

Voltage Connection

VL

Recommended Amplifier / Controller

A, G

Application

CCD camera technology
Imaging

Interlacing, image resolution enhancement

Microscopy

Optical metrology

Quality assurance


 MORE IMAGES 

·  Curve Showing Settling Time

·  Dimensional Drawing

·  Graph


 DOWNLOADS 

Description/Datasheet




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