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 All Categories    Z-/Tip/Tilt Stages (with Aperture)
All Categories > Nanopositioning: Piezo Stages,
Actuators, Piezo Controllers, Sensors
> Piezo Nanopositioning Systems > Z-/Tip/Tilt Stages (with Aperture)
 
 

Z-/Tip/Tilt Stages (with Aperture)


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Product Image - Nanopositioning Stage With Aperture

High-Dynamics Vertical Nanopositioning/Scanning Stage


  • High Stiffness for High-Dynamics Operation
  • Up to 15µm Vertical Travel Range
  • <1 nm Resolution
  • Straightness of travel <10 µrad
  • Clear Aperture with 25 mm Diameter
Product Image - Compact Piezo Elevation Stage with Aperture

Compact Piezo Elevation Stage with Aperture

(2)
  • Small Footprint: 60 x 60 mm
  • For Cost-Sensitive Applications
  • 100 µm Travel
  • Range Resolution to 0.2 nm
  • Clear Aperture : 20 x 20 mm
  • PICMA® High-Performance Multilayer Piezo Actuators
Product Image - Low-Profile Z/Tip/Tilt Piezo Nanopositioning Stages for Microscopy

Low-Profile Z/Tip/Tilt Piezo Nanopositioning Stages for Microscopy

(4)
  • Lower Profile for Easy Integration: 16.5 mm
  • Z and Tip/Tilt Versions
  • Fast Response
  • 100 µm Linear Travel Range
  • 80 x 80 mm Clear Aperture
  • PICMA® High-Performance Multilayer Piezo Actuators for Superior Lifetime
  • Combination with Long Travel Microscopy Stages
Product Image - Low-Profile Z/Tip/Tilt Piezo Nanopositioning Stages for Microscopy with Parallel Metrology

Low-Profile Z/Tip/Tilt Piezo Nanopositioning Stages for Microscopy with Parallel Metrology

(2)
  • Lower Profile for Easy Integration: 16.5 mm
  • Z and Tip/Tilt Versions
  • Choice of Strain Gauge (Lower Cost) or Capacitive Sensors (Higher Performance)
  • 100 µm Linear Travel Range, 1 mrad Tilt
  • 80 x 80 mm Clear Aperture
  • PICMA® High-Performance Multilayer Piezo Actuators for Superior Lifetime
  • Ideal for fast Z-Stack Acquisition and 3D Deconvolution Imaging
Product Image - Z/Tip/Tilt Piezo Flexure Nanopositioning / Scanning Stages with Parallel Metrology

Z/Tip/Tilt Piezo Flexure Nanopositioning / Scanning Stages with Parallel Metrology

(9)
  • Precision Trajectory Control
  • Parallel-Kinematics/Metrology for Enhanced Responsiveness / Multi-Axis Precision
  • Travel Ranges to 200 µm / 4 mrad
  • Clear Aperture 66 x 66 mm
  • Direct Metrology with Capacitive Sensors for Highest Precision
  • PICMA® High-Performance Multilayer Piezo Drives
Product Image - PIFOC High-Speed Microscope Objective Nanofocusing/Scanning Z-Drives

PIFOC™ High-Speed Microscope Objective Nanofocusing/Scanning Z-Drives


  • Scans and Positions Objectives with Sub-nm Resolution
  • Low Inertia for Fast Settling
  • Frictionless Precision Flexure Guiding System
  • Travel to 100 µm
  • Straightness of Travel ≤13 µrad
  • PICMA® High-Performance Multilayer Piezo Drives
Product Image - PIFOC High-Speed Nanofocusing/Scanning Z-Drives with Direct Metrology

PIFOC® High-Speed Nanofocusing/Scanning Z-Drives with Direct Metrology

(4)
  • Scans and Positions Objectives with Sub-nm Resolution
  • High Linearity and Stability with Direct-Measuring Sensors
  • Travel to 100 µm, fast Settling Time
  • Very Straight Motion for Enhanced Focus Stability
  • Ask about DIC Prism Holder Option
  • Compatible with Metamorph™ Imaging Software
  • Quick Lock Adapter for Easy Attachment
Product Image - IFOC Long-Range, High-Speed Nanofocusing Z-Drives with Direct Metrology

PIFOC® Long-Range, High-Speed Nanofocusing Z-Drives with Direct Metrology

(3)
  • Scans and Positions Objectives with Sub-nm Resolution
  • High Linearity and Stability with Direct-Measuring Capacitive Sensors
  • Travel to 460 µm, Fast Response & Settling Time
  • Frictionless Precision Flexure Guiding System
  • Enhanced Guiding Precision for Better Focus Stability
  • Ask about DIC Prism Holder Option
  • Controller Compatible with Metamorph™ Imaging Software
  • Quick Lock Adapter for Easy Attachment


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